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Currently, the actual direction is the search for functional layers for various optoelectronic
devices. A promising candidate as a basis for many such structures is zinc oxide (ZnO), which
combines a number of unique optical and photoelectric properties. However, the characteristics of
ZnO thin films can vary significantly depending on the chosen synthesis method and specific production
conditions. One of the varieties of the sol-gel method suitable for the synthesis of
nanoscale films is the dip-coating method. The paper presents the results of the synthesis of thin
films of zinc oxide on glass substrates by the method of vertical drawing from ZnO alcohol sol.
The effect of the elongation rate on the structural and optical properties of synthesized ZnO films
was studied using spectral ellipsometry and spectral photometry. By the method of spectral
ellipsometry, it was found that the change in the rate of elongation significantly affects the thickness
and porosity of the synthesized zinc oxide layers. The analysis of the obtained dependence of
the film thickness on the pulling speed showed that in the vertical pulling method, the growth of
zinc oxide on glass substrates can be realized in two modes: in capillary forces mode and in drying
mode. At the same time, transmission spectra were measured for synthesized ZnO films by
spectral photometry, the analysis of which showed the effect of the elongation rate on the position
of the edge of fundamental absorption. It was found that the main cause of the resulting.